Core Facility I: Atomic Scale and Tomographic Materials Characterization

Instrument Location Person in Charge
Atom Probe Tomography, Cameca, LEAP 5000XR IC 03-220 Dr. Yujiao Li
Transmission Electron Microscope, JEOL JEM ARM200F Dr. Aleksander Kostka
Scanning Electron Microscope, JEOL JSM-7200F IC 03-222 Dr. Aleksander Kostka
Focused Ion Beam System, FEI, Helios NanoLab G4 CX IC 03-222 Dr. Yujiao Li

Dr. Aleksander Kostka

X-Ray Diffractometer, Bruker D8 Discover IAN 01-02 Dipl.-Ing. Steffen Salomon (WdM)
X-Ray Tomography, RX Solutions  EasyTom IAN 01-02 Dr. Simon Klein (WT)
Low-energy ion polisher ICFO 05-355 Dr. Aleksander Kostka