Jeol JEM-ARM200F NEOARM
(Photo @ Markus Steur / THIEMT) |
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Specifications:
– HT: 80, 200kV, Cold FEG
– Resolution: 80pm@200kV, 100pm@80kV
– EDX 2 × 100mm2, resolution ≤ 133eV
– EELS resolution ≤ 0.3eV
Key features
– Probe forming Cs-corrector with auto-alignment system
– E-ABF Enhanced light atom contrast
– Piezo controlled stage; tilt ±35° in a and ±30° in b
– CMOS 4k camera (Gatan One-view, 25fps@4k res.)
– Atomic resolution EDS system
– Gatan GIF (EELS, EF-TEM)
– Simultaneous EDX and EELS acquisition
– TEM / STEM tomography
– Dual-axis tomography holder
– Precession diffraction (PED)
– ASTAR system (EBSD-TEM like orientation and phase mapping)
– 3D electron diffraction tomography (structure determination
– Remote operation