Core Facility I: Atomic Scale and Tomographic Materials Characterization

Instrument Location Person in Charge
Atom Probe, Cameca, LEAP 5000XR ZGH 03-302 Dr. Yujiao Li
Transmission Electron Microscope, JEOL JEM ARM200F ZGH 03-311 Dr. Aleksander Kostka
Scanning Electron Microscope, JEOL JSM-7200F ZGH 03-306 Dr. Aleksander Kostka
Focused Ion Beam System, FEI, Helios NanoLab G4 CX ZGH 03-312 Dr. Yujiao Li

Dr. Aleksander Kostka

X-Ray Diffractometer, Bruker D8 Discover ZGH 03-165 M. Sc. Tobias Piotrowiak (WdM)
X-Ray Tomography, RX Solutions  EasyTom ZGH 03-161 M.Sc. Johannes Boes (WT)
Low-energy ion polisher ICFO 05-355 Dr. Aleksander Kostka