| Instrument | Location | Person in Charge |
| Atom Probe, Cameca, LEAP 5000XR | ZGH 03-302 | Dr. Yujiao Li |
| Transmission Electron Microscope, JEOL JEM ARM200F | ZGH 03-311 | Dr. Aleksander Kostka |
| Scanning Electron Microscope, JEOL JSM-7200F | ZGH 03-306 | Dr. Aleksander Kostka |
| Focused Ion Beam System, FEI, Helios NanoLab G4 CX | ZGH 03-312 | Dr. Yujiao Li
Dr. Aleksander Kostka |
| X-Ray Diffractometer, Bruker D8 Discover | ZGH 03-165 | M. Sc. Tobias Piotrowiak (WdM) |
| X-Ray Tomography, RX Solutions EasyTom | ZGH 03-161 | M.Sc. Johannes Boes (WT) |
| Low-energy ion polisher | ICFO 05-355 | Dr. Aleksander Kostka |
