Bruker D8 Discover
 |
|
Specifications:
- High-brilliance IµS microfocus X-ray source (Cu)
- VÅNTEC 500 – 2D detector
- LYNXEYE XE-T detector
- Vacuum chuck for samples up to 5” ø
- TC-Dome temperature stage
Key features:
- Spatial resolution down to a beam diameter of 50 µm
- Double crystal monochromator
- ¼-circle eularian cradle by Huber
- ± 75 mm translation in X- and Y-directions
- Tilt of up to 90°
- Full Phi-rotation
- Laser-video microscope for sample positioning
- Low-temperature configuration: -180°C to 450°C
- High-temperature configuration: RT to 1100°C
Applications:
- Phase identification and high-throughput experiments
- Texture analysis
- In-depth crystal structure analysis
- Residual stress measurements
- Temperature dependent XRD experiments (in-situ)