![]() FEI Helios G4 CX |
Specifications:
Electron optics
Ion optics
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Key features:
- Schottky FEG
- Independent Pt and carbon GIS
- EasyLift EX NanoManipulator
(Fully integrated with the user interface ensuring fast movements, precision and high stability) - Retractable STEM detector
(Imaging of TEM transparent specimens) - Wide range of sample holders (including 4” wafer sample holder)
- Stage Navigation system
- Charge neutralizer
- iFast (user created recipes)
- RAPID (Remote Access Program for Interactive Diagnostics)
- Auto Slice & View
Applications:
- Target sample preparation: Etching/milling, Pt/carbon deposition, In-situ sample transfer
- Imaging (including slice and view)
- Spectroscopy & Diffraction (EDX/EBSD)