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Specifications:
- X-Y scan range: 35 μm x 35 μm typical, up to 90 µm x 90 µm (depending on the application and scanner)
- Z range: ≥3 μm
- Vertical noise floor: <40pm RMS, sensor in appropriate environment (up to 625 Hz)
- X-Y tip-velocity max.: > 2 mm/sec
- Z tip-velocity max. 12 mm/sec
- Sample holder: 210 mm vacuum chuck for samples ≤210mm in diameter, ≤15 mm thick
Key features:
- ScanAsyst
- TappingMode (air)
- Contact Mode
- Lateral Force Microscopy
- Lift Mode
- MFM
- EFM
- Force Spectroscopy
- Force Volume
- Surface Potential
- Piezoresponse Microscopy
- Force Spectroscopy
Applications:
- AFM, e.g., for roughness, topography, and grain size measurements
- PeakForce QNM (= quantitative nanomechanical measurements), for modulus mapping or phase imaging in polymers
- Kelvin Probe Microscopy, for measurements of the surface potential on electrocatalyst materials
- Possible future applications
- PeakForce TUNA for nanonmeter resolved electrical mapping
- In-situ AFM on catalyst materials
- VITA Scanning Thermal Microscopy (SThM), qualitative thermal conductivity mapping